Preventing Process Excursion With AI And Yield Management Software
The pattern recognition is an advanced AI tool in a yield management software that increases efficiency by detecting and classifying spatial patterns on the wafers. The pattern classification is automated which ensures process and yield engineers to save time while the software automatically classifies patterns in few seconds or minutes depending on the data size. Additionally, the automatic pattern classification groups all the wafers with the same pattern, which enables an advanced in-depth analysis and comparison.
Process excursions can impact product wafer sort yield as well as manufacturing costs. Thus, determining the root cause of process excursions allows engineers to create actionable plans to improve the semiconductor manufacturing process and prevent future process excursions.